You can display information labels for simulated diffraction peaks, in order to emphasize their locations, Miller Indices, d-spacings, or other data. CrystalDiffract lets you control how many labels are displayed, either by specifying a minimum intensity threshold (below which peaks will not be labelled), or by opting to hide any (weaker) overlapping labels.

To show labels Show

Do the following:

  1. Select the pattern to label.

  2. Choose: Pattern > Show Labels.

To control how many peaks should be labelled Show

Do the following:

  1. Select the pattern(s) to label.

  2. Choose: Pattern > Label Threshold and select a higher threshold value (to label fewer peaks), or a lower value (to label more peaks).

To avoid having overlapping labels Show
To change the label content Show

Do the following:

  1. Select the pattern(s) to label.

  2. Choose: Pattern > Label Content and select which items should be shown in the label.

To change the label position or style Show

Do the following:

  1. Select the pattern(s) to label.

  2. Show the Format List by clicking the Inspector button in the toolbar, or by choosing: View > Layout > Show Inspector.

  3. Open the Labels Group to reveal controls for setting the label colour, position, style, threshold and content.

Note: Displaying many peak labels will increase the time taken to plot. For best results, choose a high threshold, so that only the most-intense peaks are labelled, or use the Hide Overlapping Peaks option to suppress any (weaker) labels.

See Also

Using peak tips

Searching reflexions